Back
Knowledge

Low/high Temperature Test Chamber for high-low temperature resistance test of electron tubes

Abstract: 高低温试验箱用于电子管的耐高低温性试验,以评估其在极端温度下的性能变化。电子管作为电子器件,常用于信号放大和调节。试验步骤包括预热电子管、在高温条件下进行测试、恢复至室温后再进行低温测试,最后检查电子管的外观和性能。在高温试验中,需记录电子管的失真和噪声等参数;在低温试验中,则关注其输出功率和频率等指标。通过这些测试,可以确定电子管在不同温度环境下的可靠性和稳定性,确保其在实际应用中的有效性。

The high-low Temperature Test Chamber can be used for high-low temperature resistance tests of electronic tubes. A vacuum tube is an electronic device typically used to amplify, condition, or switch electrical signals. In the high-low temperature test, by placing the electronic tube in a high temperature or low temperature environment, the high-low temperature resistance of the electronic tube can be tested, as well as its performance changes at different temperatures.

The high-low Temperature Test Chamber is used for the high-low temperature resistance test of the electron tube with picture 1


experiment method

The following are the test steps of the electron tube in the high-low Temperature Test Chamber:

  1. Preparations: Place the electron tube in a high-low Temperature Test Chamber, and set the test temperature range as required.

  2. Preheating: Before starting the test, preheat the tube at room temperature for a period of time, usually about 30 minutes to 1 hour. The warm-up time should be determined according to the specifications and test requirements of the electronic tube.

  3. High temperature test: set the temperature to a high temperature condition, generally above 100°C, determine the high temperature condition according to the specifications and test requirements, and keep it for a period of time, usually 2 to 4 hours. During the high temperature test, the performance indicators and parameters of the electron tube should be recorded, such as distortion, noise, etc.

  4. Restore: return the temperature to room temperature, and wait for a period of time at room temperature, so that the electronic tube can return to normal working condition.

  5. Low temperature test: set the temperature to a low temperature condition, generally below -40°C, determine the low temperature condition according to the specifications and test requirements, and keep it for a period of time, usually 2 to 4 hours. During the low temperature test, the performance indicators and parameters of the electron tube should be recorded, such as output power, frequency, etc.

  6. Repeat the test: as needed, the above steps can be repeated to further test the performance of the electronic tube.

  7. End of test: At the end of the test, the tube should be removed and inspected for appearance and performance. At the same time, test results and data should be recorded for subsequent analysis and evaluation.

NBCHAO reminds you: the use of high-low Temperature Test Chambers needs to be carried out in strict accordance with the operation manual and safety regulations to ensure the accuracy and safety of the test.

Products required
Relevant knowledge
Guess you like it