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Application of low/high Temperature Test Chamber in BGA high-low temperature resistance test

Abstract: 本文介绍了高低温试验箱在BGA(Ball Grid Array)耐高低温试验中的应用。BGA是一种广泛应用于电子产品的集成电路封装技术,其耐高低温性能对于确保电子产品的可靠性尤为重要。耐高低温试验旨在验证BGA封装在极端温度环境下的稳定性和可靠性,以防止因高温导致的热膨胀、断裂或焊点开裂,及低温引起的冷脆性失效。试验步骤包括:将BGA置于试验箱中,设置并维持高低温交替环境,监测其温度、电阻值和电容值等参数。试验结束后,评估BGA的性能和稳定性,以确保其满足使用要求。这一过程确保了BGA在实际应用中的高品质和长寿命。

BGA (Ball Grid Array) is a packaging technology that is widely used in integrated circuit chips in modern electronic products and requires good high-low temperature resistance. The high-low temperature resistance test is to verify the reliability and stability of the BGA package. In a high-temperature environment, BGA may suffer from problems such as thermal expansion, fracture, and solder joint cracking, while in a low-temperature environment, BGA may be affected by cold brittleness, resulting in failure or damage. Through the high-low temperature resistance test, the stability and reliability of BGA packaging in different temperature environments can be evaluated, and high-quality integrated circuit packaging technology can be provided for the production of electronic products.

Application of high-low Temperature Test Chamber in BGA high-low temperature resistance test with picture 1

The high-low Temperature Test Chamber is also widely used in the high-low temperature resistance test of BGA (Ball Grid Array Packaging) to test the performance and stability of BGA in high temperature and low temperature environments to evaluate its scope of application and service life.

experiment procedure

(1) Place the BGA to be tested in a high-low Temperature Test Chamber, and adjust the temperature of the Test Chamber to a set high temperature value (eg 100°C).

(2) Keep the temperature stable for a period of time (such as 1 hour), and then adjust the temperature of the Test Chamber to the set low temperature value (such as -40°C).

(3) Keep the temperature stable for a period of time (for example, 1 hour), and then adjust the temperature of the Test Chamber back to the set high temperature value.

(4) Repeat the above process many times to test the performance and stability of BGA in the high-low temperature alternating environment.

(5) During the test, BGA parameters can be monitored and recorded, such as temperature, resistance value, capacitance value, etc.

(6) After the test is completed, evaluate the performance parameters and stability of the BGA to determine whether it meets the requirements for use.

NBCHAO reminds you: the high-low temperature test parameters and test standards of BGA may be different, and the specific test steps should be adjusted according to the product type and relevant standards. At the same time, sufficient safety measures need to be taken before the test to ensure that no safety accidents will occur during the test.

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