Discussion on the use and testing of Leeb Hardness Tester
With the continuous development of electronic technology, the application of Leeb Hardness Tester is becoming more and more extensive, and a Tester needs to master the product model, structure and working principle of the Leeb Hardness Tester as well as its characteristics and advantages. Only by mastering the matters to be paid attention to during the testing process can the accurate testing of the indication value of the Leeb Hardness Tester be ensured.
The Leeb Hardness Tester is mainly composed of two parts: the impact device and the display device. Domestic products are generally formed by connecting the impact device and the display device through a data transmission cable, while the foreign-produced Leeb Hardness Tester usually has the display device and the impact device as a whole, and the display device is on the impact device. Common impact device types are D type, DC type, D+15 type, G type, E type, C type, DL type. Different impact devices have different uses, see Table 1.
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