Germany PHYNIX Sur fix ® E - F iron-based statistical film thickness meter
Surfix ® E Family Series Surfix F is an iron-based statistical film thickness meter, with F1.5 external fixed probe, Measurement range 1~ 1500μm, can measure the film thickness on magnetic metal (iron/steel) substrate, accuracy +/- 1%.
Model：
Surfix®E-F
PHYNIX
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- SKU
- NB012545
- Measurement principle
- magnetic Induction
- Measurement range
- 0~1500μm
- margin of error
- ±1%
- resolution
- 0.1μm
- Minimum measurement surface
- 5*5mm
- Minimum radius of curvature
- Convex 1.5mm; Concave 5mm
- thinnest substrate
- 0.2mm
- probe
- Line probe
- Probe size
- Φ14*83mm
- Calibrated mode
- Factory calibrated, zero calibrated and film calibrated
- statistical function
- Measurement times, MAX Maximum, MIN Minimum, Average, Standard deviation
- icon function
- none
- Interface
- Infrared
- Data storage
- 2 × 100 Measured values
- Standards
- DIN，ISO，ASTM，BS
- Display screen
- Backlit, 4-digit alphanumeric, height 10mm (0.4 inches)
- Operating temperature
- 0~60℃
- Protection level
- IP52
- Weight
- 205G (including probe and battery)
- Dimension
- 137*66*23mm
- Probe contact temperature
- -15~60℃
Surfix®E-F
Film thickness meter based on iron
Surfix® E Family series Surfix F is an iron-based statistical film thickness meter, with F1.5 external fixed probe, with a measurement range of 1~1500μm, which can measure the thickness of the film layer on the magnetic metal (iron/steel) D substrate, with a measurement accuracy of ± (1μm+1% of the measured value) and a resolution of 0.1μm. With infrared interface for convenient data transmission, the host protection level is IP52.
Application
electroplate
paint
Automotive industry
chemical industry
Aerospace
shipbuilding
Tire manufacturing industry
Specifications
| Principle | magnetic induction |
| Measuring range | 0~1500μm |
| precision | ± (1 μm + 1% m) |
| resolution | 0.1 μm or < 0.2% of the measured value |
| display | Backlit, 4 alphanumeric, height 10 mm (0.4 inches) |
| Calibration method | Factory calibration, zero point calibration, thin film calibration Drift function: plus or minus a constant value |
| statistics | Number of measurements, average, standard deviation, minimum, maximum |
| Data storage | 2*100 measurements |
| interface | Infrared/wire |
| Operating temperature | 0℃~60℃ |
| Surface temperature | -15℃~60℃ |
| Specifications | 137mm*66mm*23mm |
| Probe specifications | ∅14mm*83mm |
| weight | 205g with probe and battery |
| Ingress protection | IP 52 (dust and dripping resistant) |
| standard | DIN, ISO, ASTM, BS |
Limit values
| The convex surface has the smallest radius of curvature | 1.5mm |
| The concave surface has the smallest radius of curvature | 5mm |
| Minimum operating height | 115mm |
| Smallest measuring area | 5×5mm |
| Minimum substrate thickness - F | 0.2mm |
FAQ
QIs the price listed on the website the final cost for overseas purchases?
ANo, it isn't. This is the ex-factory price of the product in the Chinese Mainland. In addition to this price, buyers from different countries need to account for additional costs such as shipping fees, tariffs, and others. For specific regional quotes, please consult our customer service or fill out a quotation form.
QWhat is the specific process for purchasing the product?
AFirst, please click on the quotation form on the website and fill in detailed information. Our customer service personnel will then send you a quotation based on your specific country and region, confirming payment and delivery methods. Following this, we proceed with contract signing, payment, and shipment. You can then await delivery.
QWhat should I do if the instrument I purchase needs repair?
AAfter-sales repair for overseas instruments is an unavoidable issue. Our repair terms stipulate that the sender is responsible for the shipping and insurance costs incurred for the repair. Repairs within the warranty period are free, while repair costs beyond the warranty period are determined based on the actual situation.
Knowledge
Standard