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PHYNIX Surfix®E-N Film thickness meter Specifications

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Germany PHYNIX Sur fix ® E - N non-ferrous statistical film thickness meter

Brand:PHYNIX

Model:Surfix®E-N

Name:Film thickness meter

DetailsContact
Specifications
Measurement principle eddy Current
Measurement range 0~1500μm
margin of error ±1%
resolution 0.1μm
Minimum measurement surface 5*5mm
Minimum radius of curvature Convex 1.5mm; Concave 5mm
thinnest substrate 50μm
probe Line probe
Probe size Φ14*83mm
Calibrated mode Factory calibrated, zero calibrated and film calibrated
statistical function Measurement times, MAX Maximum, MIN Minimum, Average, Standard deviation
icon function none
Interface Infrared
Data storage 2 × 100 Measured values
Standards DIN,ISO,ASTM,BS
Display screen Backlit, 4-digit alphanumeric, height 10mm (0.4 inches)
Operating temperature 0~60℃
Protection level IP52
Weight 205G (including probe and battery)
Dimension 137*66*23mm
Probe contact temperature -15~60℃
Packing list
Surfix N thickness gauge, protective case, calibration shim, suitcase, AAA battery, data transfer software, manufacturer's certificate, instruction manual.
After-sales instructions

Warranty days: 730 days

[Note] For after-sales services outside the Chinese mainland, if the instrument requires repair, the shipping and possible associated taxes shall be borne by the sender. Generation address of the manual: http://en.nbchao.com/p/12546/Specification.html , which is only used by users who purchase commodities from the NBCHAO.