TT260 Cladding Thickness Gauge This instrument is a portable measuring instrument, which can quickly, damageless, and precise measurement of coating and plating thickness. It can be used both in the laboratory and in the engineering field. By using different probes, a wide range of measurement needs can also be met. This instrument complies with the following standards: GB/T 4956─1985 Measurement of thickness of non-magnetic overlay on magnetic metal substrate -- Magnetic method GB/T 4957─1985 Thickness measurement of non-conductive overlay on non-magnetic metal substrate -- Eddy current method JB/T 8393─1996 Magnetic and eddy current cladding Thickness Gauge JJG 889─95 Magnetoresistive Thickness Gauge JJG 818─93 Eddy current Thickness Gauge
●This instrument adopts two methods of magnetic and eddy current thickness measurement, which can nondestructively measure the thickness of the non-magnetic covering layer (such as zinc, aluminum, chromium, copper, rubber, paint, etc.) on the magnetic metal matrix (such as steel, iron, alloy and hard magnetic steel, etc.) and the thickness of the non-conductive covering layer (such as rubber, paint, plastic, anodized film, etc.) on the non-magnetic metal matrix (such as copper, aluminum, zinc, tin, etc.).
●7 probes (F400, F1, F1/90°, F10, CN02, N1) can be used
●There are two measurement methods: continuous measurement mode (CONTINUE) and single measurement mode (SINGLE);
●There are two Operating Modes: direct (DIRECT) and group (A-B)
●There are five statistics: mean (MEAN), maximum (MAX), minimum (MIN), number of tests (NO.), standard deviation (S.DEV);
●Two methods can be used to calibrate the instrument, and the systematic error of the probe can be corrected by the basic calibration method;
●With storage function: 495 measured values can be stored;
●With deletion function: delete a single suspicious data that appears in the measurement, and also delete all the data in the storage area in order to make a new measurement;
●Set the limit: the measured value outside the limit can be automatically alarmed; A batch of measured values can be analyzed using a histogram
●With printing function: it can print measured values, statistical values, limits, and histograms;
●It has the function of communicating with the PC: the measured value and statistical value can be transmitted to the PC for further processing of the data;
●It has the function of power supply under-Voltage indication;
●There is a beep prompt during operation;
●It has the function of error prompt, which can be prompted by the screen display or beep;
●There are two shutdown modes: manual shutdown mode and automatic shutdown mode
This instrument can be widely used in manufacturing, metal processing industry, chemical industry, commodity inspection and other testing fields. It is an instrument required for the material protection profession.



Overlay | Non-magnetic overlays such as organic materials (e.g. lacquer, lacquer, enamel, enamel, plastic, anodizing, etc.) | Non-magnetic non-ferrous metal overlays (e.g. chromium, zinc, aluminum, copper, tin, silver, etc.) | |||
The thickness of the covering layer does not exceed 100 μm | The thickness of the overburden is more than 100 μm | The thickness of the covering layer does not exceed 100 μm | The thickness of the overburden is more than 100 μm | ||
Such as iron, steel | The diameter of the measured area is greater than 30 mm | F400 probe 0~400μm | F1 probe 0~1250μm | F400 probe 0~400μm | F1 probe 0~1250μm |
The diameter of the measured area is less than 30mm | F400 probe 0~400μm | F400 probe 0~400μm | F400 probe 0~400μm | F400 probe 0~400μm | |
Such as copper, aluminum, | The diameter of the measured area is greater than 5 mm | N1 probe 0~1250μm | Only for chrome-plated N1 probe 0~40μm on copper | ||
Plastic, printed circuit non-metallic matrix | The diameter of the measured area is greater than 7 mm | - | - | CN02 probe 10~200μm | |
David Beamish
Air - 《南北潮商城》
AIVARS U. FREIDENFELDS - 《Elektro-Physik》