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Deguang Electronics G-type Leeb Hardness Tester for measurement of large or heavy specimens and castings and forgings with coarse surfaces

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Deguang Electronics G-type Leeb Hardness Tester probe is suitable for the measurement of large or heavy specimens and castings and forgings with coarse surfaces. It is an optional impact device for Deguang Electronics Leeb Hardness Tester.
$1097.00/piece
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Details SPEC Con

DGC G type Probe (Sclerometer)SPEC

DGC G type Probe (Sclerometer)Details

DGC G type Probe (Sclerometer)Packing list

SKU
NB001347
Impact energy
90 (Num)
Impact device Mass
20g
Ball Hardness
1600(HV)
Ball head diameter
5mm
Ball head material
Tungsen carbide
Impact device diameter
30mm
Impact device length
254mm
Impact device Mass
250g
Maximum Specimen Hardness
650HV
Roughness class standard
N9 (ISO)
Maximum Surface Roughness of Specimen
30(UM)
Specimen Surface Roughness
7UM
Minimum specimen Weight
15 kg
Requires a stable minimum support Weight
5(kg)
Needs to be coupling time Minimum Film thickness
0.5(kg)
Minimum test Film thickness
10mm
Minimum depth of hardened layer
-mm
Indentation diameter
1.03mm
Indentation depth
53(un)
Indentation diameter
0.90mm
Indentation depth
41(un)
Indentation diameter
-mm
G type
Probe (Sclerometer)
Deguang Electronics G-type Leeb Hardness Tester for measurement of large or heavy specimens and castings and forgings with coarse surfaces Picture

G type introduction

Deguang Electronic G-type Leeb Hardness Tester probe is suitable for measuring large or heavy test pieces and castings and forgings with rough surface. It is an optional impact device for Deguang Electronic Leeb Hardness Tester.

Probe Measurement Applications

D-type probe : measuring common parts

C-type probe : measure small or thin specimens and surface hardened layers

DC type probe : measure inner surface of inner hole or narrow space

D+15 type probe : measure groove or concave surface

DL type probe : measure slender and narrow groove body

G-type probe : measure large or heavy test pieces and castings and forgings with rough surface

Pictures

Appearance of D-type/DC-type/DL-type Probe of Deguang Electronic Leeb Hardness Tester

Deguang Electronic Leeb Hardness Tester Probe D+15/C/G Appearance


FAQ
QIs the price listed on the website the final cost for overseas purchases?
ANo, it isn't. This is the ex-factory price of the product in the Chinese Mainland. In addition to this price, buyers from different countries need to account for additional costs such as shipping fees, tariffs, and others. For specific regional quotes, please consult our customer service or fill out a quotation form.
QWhat is the specific process for purchasing the product?
AFirst, please click on the quotation form on the website and fill in detailed information. Our customer service personnel will then send you a quotation based on your specific country and region, confirming payment and delivery methods. Following this, we proceed with contract signing, payment, and shipment. You can then await delivery.
QWhat should I do if the instrument I purchase needs repair?
AAfter-sales repair for overseas instruments is an unavoidable issue. Our repair terms stipulate that the sender is responsible for the shipping and insurance costs incurred for the repair. Repairs within the warranty period are free, while repair costs beyond the warranty period are determined based on the actual situation.
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