China

YUEFENG 755 UV-Visible Spectrophotometer Wavelength range 195~ 1000nm

Yuefeng 755 UV-Visible Spectrophotometer is 195~ 1000nm Wavelength range UV-Visible Spectrophotometer, using imported tungsten lamp and xenon arc, Yuefeng 755 optional software, with photometric measurement and quantitative detection.
Model:
Certificate

YUEFENG 755 UV-Visible SpectrophotometerSPEC

YUEFENG 755 UV-Visible SpectrophotometerDetails

YUEFENG 755 UV-Visible SpectrophotometerPacking list

SKU
NB017249
Optical inspection system
Aberration cancellation (1200L/mm Grating)
Light spectrum Bandwidth
2nm
Wavelength range
195m~1000nm
Wavelength Precision
±1nm
Wavelength Repeatability
≤0.5nm
Photometric range
0~200.0%T、-0.301~1.999A
Photometric Precision
±0.5%T
Luminosity Repeatability
≤0.2%T
stray light
≤0.3%T@220nm,360nm
printout
serial port
analysis software
optional
Light source
Tungsten halogen lamp, deuterium lamp
Concentration range
0~1999
Drift
≤0.002A/h@500nm
755
UV-Visible Spectrophotometer
YUEFENG 755 UV-Visible Spectrophotometer Wavelength range 195~ 1000nm Picture

Instrument Introduction

  • One-click automatic correction of ABS value.

  • Four-digit LCD liquid display with digital display of measured values.

  • With imported tungsten lamp and deuterium lamp, the service life is as long as 2000 hours.

  • The large sample chamber can be placed in 5mm~100mm cuvettes.

  • The data output port is RS232, which can be connected to a computer and a printer



Features

  • Establish standard modes: C=FXABS, F=C/ABS.

  • Find F=C/ABS

           a. The background of the ABS file is zeroed and the absorbance of the known standard solution is measured

           b. Calculate F-value: F=C/ABS

           c. F file to the required number (F range: 1-1999

           d. C-file test sample

  • You can connect directly to a printer (optional) and click data or graphs.

FAQ
QDoes this UV-Visible Spectrophotometer meet the GB/T1721 standard?
A The UV-Visible Spectrophotometer is suitable for GB/T1721. Please consult customer service for detailed application definition.
Knowledge
Standard