| Measurement of plating | Standard configuration: can measure Cr, Ni, Cu, Zn, Sn, Ag, Au, Cd, Co, In, Pb and other single metal platings, composite platings, alloy platings |
| Platings substrate | Metal, Non-metallic, NdFeB, etc. (substrate is basically not limited) |
| Number of coating layers | Single layer and composite multi-layer |
| test size | φ 2.4mm, φ 1.7mm (optional φ 1.2, φ 1.0, φ 0.8) |
| data processing | Connectivity: The computer monitor displays the thickness and potential changes during the test in real time Linear dispersion, stand-alone: The LCD screen of the instrument displays the thickness and potential values during the test, and the test results cannot be stored |
| Measurement range | 0~300μm (the best use range is 0.03~ 75um, if it exceeds 75um, the error will gradually increase) |
| error of indication | ≤±10% |
| reproducibility | ≤5% |
| resolution | Thickness: 0.01μm; Potential: 0.01mv |
| potential range | 0~3000mv |
| Potential Accuracy | 0.01mv |
Warranty days: 365 days
Non-artificially caused product quality problems, the manufacturer provides 1 year free warranty service