The HACA-2000 high-precision color analyzer uses a pulse xenon lamp to simulate the D65 light source, adopts the geometric lighting condition of d/8 (diffuse illumination/8-degree reception), and has a dual-light path design to achieve spectral reflectance of the object surface and CIE three-dimensional color High-precision measurement of spatial rectangular coordinates L* (lightness), a*, b*, chroma Cab, hue hab, etc., in line with the color difference of CIE, ASTM and other international standards and GBT national standards. The system can be widely used in different industries such as plastics, textiles, printing and dyeing, dyes, and printing. It can not only realize product quality control and measure product color parameters, but can also be used to measure the reflected color of object surfaces in the laboratory.
1) Pulse xenon light source, high brightness, long life and good stability.
2) Very good repeatability: The unique dual-light path design can monitor and automatically compensate the light source, reducing errors caused by changes in the light source.
3) Automatic zoom function: According to different measurement apertures, the system can realize automatic zoom.
4) Spectrum measurement technology: It adopts back-illuminated high-precision array Detectors, good diffraction gratings, and utilizes a number of technologies to ensure high resolution, low stray light and high sensitivity of spectral measurement.
5) Excellent dark color domain measurement performance: When measuring low reflectivity or transmittance materials, it still has high accuracy and repeatability.
6) Easy to maintain: It has built-in correction and calibration functions, making it convenient for users to zero and calibrate themselves.
7) With UV filtering function.
8) SCI/SCE simultaneous measurement: SCI (including specular reflection)/SCE (eliminating specular reflection) is optional.
1) Measurement geometry: d/8 (diffuse illumination/8° reception) d/8 in line with ISO, DIN, CIE, ASTM;
2) Multi-aperture and automatic recognition: LAV, MAV and SAV optional; LAV: Ф28mm; MAV: Ф11mm; SAV: 5Ã7mm;
Main Specifications
1) Measurement function: reflection;
2) Color space: L*a*b, L*C*h, WI, YI, YXY, CMC, X, Y, Z, R, G, B and other parameters;
3) Lighting/reception conditions: Reflection: d/8 (diffuse lighting/8° reception) meets ISO, DIN, CIE, ASTM requirements;
4) SCI/SCE simultaneous measurement: SCI (including specular reflection)/SCE (eliminating specular reflection) optional
5) Wavelength range: 380nm-780nm
6) Wavelength interval: up to 0.1nm
7) Light source: pulse xenon lamp
8) Reflectivity range: 0-200%, resolution 0.001%
9) Measuring diameter:
Reflection measurement aperture: LAV: Ф28mm; MAV: Ф11mm; SAV: 5Ã7mm.
Different measurement apertures can be replaced for measurement objects of different sizes, and the system can automatically identify the corresponding aperture size after replacement.
10) UV filter function: excluding UV light, including UV light: 420 nm, 460 nm and UV light calibration mode
11) Communication interface: RS232/USB
12) Instrument size: 310mmÃ275mmÃ605mm
13) Weight: about 20kg
Note: *1 Measure the calibrated whiteboard 30 times at 10s intervals;