Shanghai PUSHEN PS 2925 Digital Display Micrometer
Shanghai PUSHEN PS 2925 Digital Display Micrometer is used to test the inner and outer diameter and depth of the sample. Measurement range is 0~25mm. PS 2925 Digital Display Micrometer is made of all stainless steel.
Model：
PS 2925
Pushen PS 2925 Digital MicrometerSPEC
Pushen PS 2925 Digital MicrometerDetails
Pushen PS 2925 Digital MicrometerPacking list
- SKU
- NB022140
- Measurement range
- 0~25mm
- resolution
- 0.001mm
- Indication variability
- 0.001mm
- Power Supply
- 1.5V SRW
PS 2925
Digital Micrometer
Introduction
The digital vernier caliper is used to quickly measure the inner diameter, outer diameter, depth and step of the sample, and can be used for direct measurement and comparative measurement. The calipers are made of all stainless steel and are interchangeable in metric and imperial units.
FAQ
QIs the price listed on the website the final cost for overseas purchases?
ANo, it isn't. This is the ex-factory price of the product in the Chinese Mainland. In addition to this price, buyers from different countries need to account for additional costs such as shipping fees, tariffs, and others. For specific regional quotes, please consult our customer service or fill out a quotation form.
QWhat is the specific process for purchasing the product?
AFirst, please click on the quotation form on the website and fill in detailed information. Our customer service personnel will then send you a quotation based on your specific country and region, confirming payment and delivery methods. Following this, we proceed with contract signing, payment, and shipment. You can then await delivery.
QWhat should I do if the instrument I purchase needs repair?
AAfter-sales repair for overseas instruments is an unavoidable issue. Our repair terms stipulate that the sender is responsible for the shipping and insurance costs incurred for the repair. Repairs within the warranty period are free, while repair costs beyond the warranty period are determined based on the actual situation.