China

INESA INESA SGW X-4B Melting point meter Melting point meter

SE
Microscope observation method, support capillary method and hot table method. With 0.1 ℃ temperature resolution and +/- 1 ℃ repeability, with Wind Shield to reduce environment interference. Binocular stereo Microscope provides 40X-100X zoom
$850.00/set
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Model:

INESA SGW X-4B Melting point MeterSPEC

INESA SGW X-4B Melting point MeterDetails

INESA SGW X-4B Melting point MeterPacking list

SKU
NB027957
Temperature range
RT+~320℃
Measuring method
visual
Measuring method
Capillary method, hot table method
Temperature Resolution
0.1℃
Repeatability
±1℃(≤200℃);±2℃(>200℃)
Observation method
Binocular Stereo Microscope
magnification
40X-100X zoom
Power Supply
220V±22V 50Hz±1Hz
Dimension
269×160×435mm
Net Weight of instrument
4.kg
SGW X-4B
Melting point Meter
Microscope observation method, support capillary method and hot table method. With 0.1 ℃ temperature resolution and +/- 1 ℃ repeability, with Wind Shield to reduce environment interference. Binocular stereo Microscope provides 40X-100X zoom
INESA INESA SGW X-4B Melting point meter Melting point meter Picture

Features

Determination of the melting point of a substance. It is mainly used for the determination of crystalline organic compounds such as chemicals, textiles, fuels, spices, etc. The instrument uses the microscope observation method, which can be determined by both the capillary method and the slide-to-coverslip method (hot stage method).


The SGW X-4A and SGW X-4B are equipped with a draft shield to reduce the influence of the environment on the test results.