China

INESA SGW X-4A Melting point meter

SE
Support capillary method and hot table method to determine melting point, suitable for crystalline organic compounds in chemical, Spinning & weaving, fuel and other fields. With 40X Microscope magnification, temperature range RT +~ 320 ℃, temperature resolution 0.1 ℃
$727.00/set
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INESA SGW X-4A Melting point MeterSPEC

INESA SGW X-4A Melting point MeterDetails

INESA SGW X-4A Melting point MeterPacking list

SKU
NB027958
Temperature range
RT+~320℃
Measuring method
visual
Measuring method
Capillary method, hot table method
Temperature Resolution
0.1℃
Repeatability
±1℃(≤200℃);±2℃(>200℃)
Observation method
Monocular Microscope
magnification
40X
Power Supply
220V±22V 50Hz±1Hz
Dimension
215×140×395mm
Net Weight of instrument
3.6kg
SGW X-4A
Melting point Meter
Support capillary method and hot table method to determine melting point, suitable for crystalline organic compounds in chemical, Spinning & weaving, fuel and other fields. With 40X Microscope magnification, temperature range RT +~ 320 ℃, temperature resolution 0.1 ℃
INESA SGW X-4A Melting point meter Picture

Features

Determination of the melting point of a substance. It is mainly used for the determination of crystalline organic compounds such as chemicals, textiles, fuels, spices, etc. The instrument uses the microscope observation method, which can be determined by both the capillary method and the slide-to-coverslip method (hot stage method).


The SGW X-4A and SGW X-4B are equipped with a draft shield to reduce the influence of the environment on the test results.