INESA SGW X-4 Melting point meter

SGW X-4

Melting point Meter

Microscope observation, support capillary method and hot table method to determine melting point, suitable for crystalline organic compounds in chemical, Spinning & weaving, fuel and other fields. Microscope magnification up to 40X, temperature range RT +~ 320 ℃, temperature resolution of 1 ℃

Features

Determination of the melting point of a substance. It is mainly used for the determination of crystalline organic compounds such as chemicals, textiles, fuels, spices, etc. The instrument uses the microscope observation method, which can be determined by both the capillary method and the slide-to-coverslip method (hot stage method).

Packing list：host X1, manual X1, certificate X1, warranty card X1

[Note]Because the manufacturer's packaging may be updated or upgraded, the detailed packaging list shall be subject to the latest standard configuration of the manufacturer.