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INESA WKL-702 Particle image analyzer with imported Microscope

SE
Imported Microscope and high resolution digital CCD camera can accurately measure dozens of geometric parameters such as roundness, area and diameter of particles, and draw distribution maps through linear or nonlinear statistical methods. Measurement range is wide (0.1~ 3000μm), and the maximum resolution is 0.1 microns/pixel
$9631.00/set
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INESA WKL-702 Particle image analyzer (Microscope)SPEC

INESA WKL-702 Particle image analyzer (Microscope)Details

INESA WKL-702 Particle image analyzer (Microscope)Packing list

SKU
NB033692
Measurement range
0.1~3000μm
Total Magnification
8000 times
Maximum resolution
0.1 micron/pixel
Repeatability
Error ≤ +/- 1%
Automatic segmentation speed
≤ 1 second
Digital Camera (CCD)
5 million pixels
data storage
Computer with additional
communication interface
USB
Operating system
Windows 98/XP/7/8/10
Power Supply
AC220V ±10% 200W
Dimension
270mmX410mmX440mm
Net Weight of instrument
15kg
WKL-702
Particle image analyzer (Microscope)
Imported Microscope and high resolution digital CCD camera can accurately measure dozens of geometric parameters such as roundness, area and diameter of particles, and draw distribution maps through linear or nonlinear statistical methods. Measurement range is wide (0.1~ 3000μm), and the maximum resolution is 0.1 microns/pixel
INESA WKL-702 Particle image analyzer with imported Microscope Picture

Combining traditional microscopic measurement methods with modern image technology, it is a particle analysis instrument that uses image method for particle morphology analysis and particle measurement, which is composed of optical microscope, digital CCD camera and particle image processing and analysis software. The system transmits the image to the computer through a special digital camera, and analyzes and processes the image through the special particle image processing and analysis software, which has the characteristics of intuitive, image, accurate and wide measurement range.


1. A variety of image processing methods: image enhancement, image overlay, local extraction, fixed magnification, contrast, brightness adjustment, particle positioning, automatic segmentation and dozens of other functions.


2. Basic measurement with dozens of geometric parameters such as roundness, curve, perimeter, area, diameter, etc.


3. The distribution map can be drawn in a linear or nonlinear statistical way according to the particle size, area, shape and other parameters of particle size.

Serial models

Modelname of articledisposition
WKL-702
Particle image analyzerConfiguration 1: Chinese microscope
Configuration 2: Imported microscope
WKL-708
Smart particle image analyzerConfiguration 1: Chinese microscope
Configuration 2: Imported microscope
WKL-722
Dust topography dispersion TesterConfiguration 1: Chinese microscope
Configuration 2: Imported microscope
WKL-728
Intelligent dust topography dispersion TesterConfiguration 1: Chinese microscope
Configuration 2: Imported microscope



FAQ
QIs the price listed on the website the final cost for overseas purchases?
ANo, it isn't. This is the ex-factory price of the product in the Chinese Mainland. In addition to this price, buyers from different countries need to account for additional costs such as shipping fees, tariffs, and others. For specific regional quotes, please consult our customer service or fill out a quotation form.
QWhat is the specific process for purchasing the product?
AFirst, please click on the quotation form on the website and fill in detailed information. Our customer service personnel will then send you a quotation based on your specific country and region, confirming payment and delivery methods. Following this, we proceed with contract signing, payment, and shipment. You can then await delivery.
QWhat should I do if the instrument I purchase needs repair?
AAfter-sales repair for overseas instruments is an unavoidable issue. Our repair terms stipulate that the sender is responsible for the shipping and insurance costs incurred for the repair. Repairs within the warranty period are free, while repair costs beyond the warranty period are determined based on the actual situation.