Defelsko The RTR H1 Surface Roughness Measuring Instrument, model standard RTRH1-E, is oneThe standard model of the RTR H-Series Surface Roughness Tester, in one-piece construction, is a digital display spring micrometer and the Testex Press-O-Film uses replica tape to measure and record the surface roughness profile.


1. Automatically subtract all readings from a 50.8 micron (2 mil) substrate
2. Minimize inspector workload by reducing the number of copies that need to be made to ensure accuracy.
3. The reset function can restore the factory settings immediately
4. The accuracy of measurement is higher than that of spring measuring instrument
5. Durable. The housing has a good degree of protection against solvents, acids, oils, water and dust, and has a rubber housing for shock protection
6. Obtain more accurate peak and valley height value (roughness value) measurement.
7. The calibration certificate can be traced back to PTB
8. The PosiTector main unit is compatible with other PosiTector series probes, such as RTR, SPG, 6000, 200, DPM, UTG.
9. Inverted display can be set
10. Multiple languages are available
11. Mil/micron conversion
12. It can display continuous display of average, standard deviation, min/max height and reading
| Model | PosiTector RTR H1 | PosiTector RTR H3 | PosiTector RTR P1 | PosiTector RTR P3 |
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| Host type | Standard | Advanced | Standard | Advanced |
| Probe type | PRBRTRH | PRBRTRP | ||
| Measuring Peak (HL) | ● | ● | ● | ● |
| Measured peak density (Pd) | ● | ● | ||
| Output 2D/3D images | ● | |||
| Save the SDF surface data file | ● | |||
| Peak (HL) measurement range | 20~115 μm (0.8 to 4.5 mils) | |||
| peak(HL) accuracy | ±5 μm (±0.2 mils) | |||
| peak(HL) resolution | ±1 μm (±0.2 mils) | |||
| Anvil diameter | Ø6.3 mm (Ø0.25 inch) | |||
| Anvil pressure | 110g (1.1N) | |||
| size | 152x61x28mm | |||
| weight | 140g | |||
| standard | ASTM D4417、NACE RP0287、SSPC PA 17、SSPC-SP5、SP6、SP10、SP11-87T、AS 3894.5、ISO 8503-5等 | |||