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Leeb Hardness Tester Impact device (probe) KAIRDA DL type measurement slender narrow groove or hole

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KAIRDA DL Impact device Leeb Hardness Tester Impact device (probe) is suitable for measurement of slender narrow grooves or holes; the maximum hardness of the specimen is 940HV.
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KairDa DL type Impact deviceSPEC

KairDa DL type Impact deviceDetails

KairDa DL type Impact devicePacking list

SKU
NB004779
Impact energy
11mJ
Impact device Mass
5.5g/7.2g
Ball Hardness
1600HV
Ball head diameter
3mm
Ball head material
tungsten carbide
Impact device diameter
20mm
Impact device length
86(147)/ 75mm
Impact device Mass
50g
Maximum Specimen Hardness
940HV
Specimen Surface Roughness
1.6µm
Minimum specimen Weight
>5kg
Need stable support
2~5kg
Dense coupling is required
0.05~2kg
Minimum test Film thickness
5mm
Minimum depth of hardened layer
≥0.8mm
Hardness 300HV Indentation Diameter
0.54mm
Hardness 300HV Indentation
24µm
Hardness 600HV Indentation Diameter
0.54mm
Hardness 600HV Indentation
17µm
Hardness 800HV Indentation Diameter
0.35mm
Hardness 800HV Indentation
10µm
Application of impact device
DL type measurement slender narrow groove or hole
DL type
Impact device
Leeb Hardness Tester Impact device (probe) KAIRDA DL type measurement slender narrow groove or hole Picture

Introduction

KAIDA's Leeb Hardness Testers can basically be equipped with different impact devices for different hardness testing occasions. There are D type, C type, G type, DL type, and DC type five Hardness Tester impact devices, with different applicable materials, Diameter, length, weight, maximum measurable hardness value, indentation diameter, depth and Application.

The Leeb Hardness Tester can choose different impact devices according to the actual test requirements, and the AEDA Leeb Hardness Tester is equipped with a D-type impact device as standard.

Pictures

AEDA D-type/C-type/G-type/DL-type/DC-type Leeb Hardness Tester impact device display Figure 1

AEDA D-type/C-type/G-type/DL-type/DC-type Leeb Hardness Tester impact device display Figure 2

AEDA D-type Leeb Hardness Tester impact device display

FAQ
QIs the price listed on the website the final cost for overseas purchases?
ANo, it isn't. This is the ex-factory price of the product in the Chinese Mainland. In addition to this price, buyers from different countries need to account for additional costs such as shipping fees, tariffs, and others. For specific regional quotes, please consult our customer service or fill out a quotation form.
QWhat is the specific process for purchasing the product?
AFirst, please click on the quotation form on the website and fill in detailed information. Our customer service personnel will then send you a quotation based on your specific country and region, confirming payment and delivery methods. Following this, we proceed with contract signing, payment, and shipment. You can then await delivery.
QWhat should I do if the instrument I purchase needs repair?
AAfter-sales repair for overseas instruments is an unavoidable issue. Our repair terms stipulate that the sender is responsible for the shipping and insurance costs incurred for the repair. Repairs within the warranty period are free, while repair costs beyond the warranty period are determined based on the actual situation.
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