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Leeb Hardness Tester Impact device (probe) KAIRDA type C measurement small thin parts and surface hardening layer

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KAIRDA C-type Impact device Leeb Hardness Tester Impact device (probe) is suitable for the measurement of small and thin parts and surface hardening layer; the maximum hardness of the specimen is 1000HV.
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KairDa Type C Impact deviceSPEC

KairDa Type C Impact deviceDetails

KairDa Type C Impact devicePacking list

SKU
NB004781
Impact energy
2.7mJ
Impact device Mass
3.0g
Ball Hardness
1600HV
Ball head diameter
3mm
Ball head material
tungsten carbide
Impact device diameter
20mm
Impact device length
141mm
Impact device Mass
75g
Maximum Specimen Hardness
1000HV
Specimen Surface Roughness
0.4µm
Minimum specimen Weight
>1.5kg
Need stable support
0.5~1.5kg
Dense coupling is required
0.02~0.5kg
Minimum test Film thickness
1mm
Minimum depth of hardened layer
≥0.2mm
Hardness 300HV Indentation Diameter
0.38mm
Hardness 300HV Indentation
12µm
Hardness 600HV Indentation Diameter
0.32mm
Hardness 600HV Indentation
8µm
Hardness 800HV Indentation Diameter
0.35mm
Hardness 800HV Indentation
7μm
Application of impact device
C-type impact force is small, the surface damage is small, does not destroy the hardened layer, suitable for measurement of small thin parts and surface hardened layer.
Type C
Impact device
Leeb Hardness Tester Impact device (probe) KAIRDA type C measurement small thin parts and surface hardening layer Picture

Introduction

KAIDA's Leeb Hardness Testers can basically be equipped with different impact devices for different hardness testing occasions. There are D type, C type, G type, DL type, and DC type five Hardness Tester impact devices, with different applicable materials, Diameter, length, weight, maximum measurable hardness value, indentation diameter, depth and Application.

The Leeb Hardness Tester can choose different impact devices according to the actual test requirements, and the AEDA Leeb Hardness Tester is equipped with a D-type impact device as standard.

Pictures

AEDA D-type/C-type/G-type/DL-type/DC-type Leeb Hardness Tester impact device display Figure 1

AEDA D-type/C-type/G-type/DL-type/DC-type Leeb Hardness Tester impact device display Figure 2

AEDA D-type Leeb Hardness Tester impact device display

FAQ
QIs the price listed on the website the final cost for overseas purchases?
ANo, it isn't. This is the ex-factory price of the product in the Chinese Mainland. In addition to this price, buyers from different countries need to account for additional costs such as shipping fees, tariffs, and others. For specific regional quotes, please consult our customer service or fill out a quotation form.
QWhat is the specific process for purchasing the product?
AFirst, please click on the quotation form on the website and fill in detailed information. Our customer service personnel will then send you a quotation based on your specific country and region, confirming payment and delivery methods. Following this, we proceed with contract signing, payment, and shipment. You can then await delivery.
QWhat should I do if the instrument I purchase needs repair?
AAfter-sales repair for overseas instruments is an unavoidable issue. Our repair terms stipulate that the sender is responsible for the shipping and insurance costs incurred for the repair. Repairs within the warranty period are free, while repair costs beyond the warranty period are determined based on the actual situation.
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