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Deguang Electronics C-type Leeb Hardness Tester for measurement of small or thin specimens and surface hardening layers

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Deguang Electronics C-type Leeb Hardness Tester probe is suitable for the measurement of small or thin specimens and surface hardening layers. It is an optional impact device for Deguang Electronics Richter Hardness Tester.
$736.00/piece
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Details SPEC Con

DGC Type C Probe (Sclerometer)SPEC

DGC Type C Probe (Sclerometer)Details

DGC Type C Probe (Sclerometer)Packing list

SKU
NB004830
Impact energy
3 (Num)
Impact device Mass
3.0g
Ball Hardness
1600HV
Ball head diameter
3mm
Ball head material
Tungsen carbide
Impact device diameter
20mm
Impact device length
141mm
Impact device Mass
75g
Maximum Specimen Hardness
1000HV
Roughness class standard
N5 (ISO)
Maximum Surface Roughness of Specimen
2.5(UM)
Specimen Surface Roughness
0.4UM
Minimum specimen Weight
1.5kg
Requires a stable minimum support Weight
0.5kg
Needs to be coupling time Minimum Film thickness
0.02kg
Minimum test Film thickness
1mm
Minimum depth of hardened layer
0.2mm
Indentation diameter
0.38mm
Indentation depth
12(un)
Indentation diameter
0.32mm
Indentation depth
8(un)
Indentation diameter
0.30mm
Type C
Probe (Sclerometer)
Deguang Electronics C-type Leeb Hardness Tester for measurement of small or thin specimens and surface hardening layers Picture

Introduction to Type C

Deguang Electronic C-type Leeb Hardness Tester Probe is suitable for measuring small or thin specimens and surface hardened layers. Deguang Electronic Leeb Hardness Tester can be equipped with an impact device.

Probe Measurement Applications

D-type probe : measuring common parts

C-type probe : measure small or thin specimens and surface hardened layers

DC type probe : measure inner surface of inner hole or narrow space

D+15 type probe : measure groove or concave surface

DL type probe : measure slender and narrow groove body

G-type probe : measure large or heavy test pieces and castings and forgings with rough surface

Pictures

Appearance of D-type/DC-type/DL-type Probe of Deguang Electronic Leeb Hardness Tester

Deguang Electronic Leeb Hardness Tester Probe D+15/C/G Appearance


FAQ
QIs the price listed on the website the final cost for overseas purchases?
ANo, it isn't. This is the ex-factory price of the product in the Chinese Mainland. In addition to this price, buyers from different countries need to account for additional costs such as shipping fees, tariffs, and others. For specific regional quotes, please consult our customer service or fill out a quotation form.
QWhat is the specific process for purchasing the product?
AFirst, please click on the quotation form on the website and fill in detailed information. Our customer service personnel will then send you a quotation based on your specific country and region, confirming payment and delivery methods. Following this, we proceed with contract signing, payment, and shipment. You can then await delivery.
QWhat should I do if the instrument I purchase needs repair?
AAfter-sales repair for overseas instruments is an unavoidable issue. Our repair terms stipulate that the sender is responsible for the shipping and insurance costs incurred for the repair. Repairs within the warranty period are free, while repair costs beyond the warranty period are determined based on the actual situation.
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