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TEELEN XTL-20B Metallurgical Microscopy Infinite High Light Reuters reflection Double Illuminant

Using infinite high-beam path technology, providing a full field of view high definition image, support reflection dual Illuminant observation, fretting grid value of 0.002mm, clear detection of transparent or non-transparent samples, light field compensation to remove reflective points.
$1750.00/set
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Teelen XTL-20B Metallurgical MicroscopySPEC

Teelen XTL-20B Metallurgical MicroscopyDetails

Teelen XTL-20B Metallurgical MicroscopyPacking list

SKU
NB050652
Instrument parameters
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observation head
30 ° hinged trinocular, adjustable pupil distance 50mm-75mm30 °
eyepiece
WF10X/22mm
objective lens
Infinity flat-field color difference stress-free metallographic objective
buy
Infinity flat-field color difference stress-free metallographic objective 40X, 100X
platform
Platform size: 140MM X 120MM Moving range: 80MM X 50MM
condenser
N.A.1.25 Swinging Abbe Condenser with Variable Light Bar
Focus
Coarse and fretting coaxial focusing, using rack and pinion transmission mechanism, fretting grid value 0.002mm
Illuminant
Upper/lower lighting: LED light 5W, DC12V2A luminance adjustable
light collector
High luminance fixed lighting with dimmable bar
Color filter
Plug-in filter (green, blue, neutral) polarizer
detection tool
0.01Mm micrometer
Accessories available
1, eyepiece: WF20X 2, 1.30 million, 3 million, 5 million, 10 million pixel CMOS electronic eyepiece 3, non-stress objective: 100X (S) Oil 4, photographic device and CCD interface 0.3X, 0.4X
Optional display instrument parameters
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Product model
DM1620
Product classification
High definition integrated win10 system flat panel camera
Sensor size
1/2.3 inch sensor
effective pixel
16 million
screen
11.6 inch, resolution 1920 * 1080 IPS hard screen
CPU
Inter GLK Platform
Operating System
Windows 10, 64-bit operating system
Wifi
2.4GHz/5GHz dual-band WIFI supports 802.11a/b/g/n/ac protocol
Bluetooth
Bluetooth 4.2
interface
USB 3.0, HDMI, WIFI, Gigabit Ethernet port
pixel size
1.335um*1.335um
power supply
DC-12V/2A
basic function
Luminance, contrast ratio, Saturation, white equilibrate
Image quality adjustment
Exposure, flicker suppression, sharpness, Gamma, Cb/Cr gain adjustment
camera function
Mirror, flip
UI interface
Support full mouse user-friendly operation and touch operation
Image, video
Support 16 million photography, support 1080P video
storage function
That is, take pictures, video, picture preview, SD card formatting
tag function
Point coordinates, crosshairs, coordinate systems, text annotations
Length measurement
Line length, polyline length, Linear dispersion length, parallel line spacing, point line spacing
Geometric measurement
Line segment length, radius fixed circle, two point fixed circle, three point fixed circle, concentric circle, radius fixed circle, two point fixed circle, three point fixed circle
Geometric area measurement
Polygon, Cube
Measurement system
Comes with S-EYE test software
Appearance size
285.3*177.4*12.5mm
Single machine weight
0.9kg
standard accessories
12V/2A power supply
XTL-20B
Metallurgical Microscopy
Using infinite high-beam path technology, providing a full field of view high definition image, support reflection dual Illuminant observation, fretting grid value of 0.002mm, clear detection of transparent or non-transparent samples, light field compensation to remove reflective points.
TEELEN XTL-20B Metallurgical Microscopy Infinite High Light Reuters reflection Double Illuminant Picture

1. Instrument introduction

1. Clear, sharp and high-contrast microscopic images can be obtained under various observation methods. The complete accessories and complete configuration can flexibly combine the system and expand the functions. Ergonomic design with solid and reliable system structure.

2. This cost-effective microscope is capable of inspecting a wide range of devices and wafers. The focus mechanism and the illumination intensity control are next to each other and can be operated with the same hand. It is especially suitable for small and medium-sized semiconductor FPD inspection and circuit board slicing measurement, which meets industry standards and enhances safety and reliability.

3. The ultra-cost-effective brightfield optical system adopts infinite optical path technology, integrating brightfield, oblique illumination, polarization and other observation methods, which can present clear and sharp microscopic images under any observation, and can be selected according to the actual application, which is an effective tool for industrial testing.

2. Instrument characteristics

1. High-definition mirroring, no blurred edge of the field of view, high-definition in full view

2. Light field compensation, which can remove the reflective exposure point in the mirror image

3. The appearance is novel, and the whole machine is made of lead-free and environmentally friendly material

4. Transmissive dual light sources, which can observe transparent or non-transparent samples to achieve multi-purpose functions in one machine

5. With the original imaging system, it can realize the mirror screen display effect

FAQ
QCan this microscope observe transparent and opaque samples?
A Yes, the XTL-20B is equipped with a transparent reflection dual Illuminant, which can not only observe transparent samples such as slices, but also handle non-transparent samples such as metal parts, achieving multi-purpose in one machine and saving your equipment costs.
QWe mainly use it to inspect semiconductor wafer and circuit board slices. Is this XTL-20B Metallurgical Microscopy suitable?
A Yes! This Microscope is designed for small and medium size semiconductor and FPD inspection. It is equipped with an infinite high beam path system and a variety of observation methods, which can clearly present the wafer microstructure. For circuit board slice inspection, its 80x50mm mobile platform and 0.002mm fine-tuning accuracy enable accurate measurement of line size, which meets industry standards.
QWith what imagery system can achieve real-time measurement and recording?
A It is recommended to choose the original DM1620 high definition all-in-one machine, which comes with 16 million pixel CMOS and measurement software. It can not only display microscopic images in real time, but also support geometric measurement such as straight lines and compasses. The measurement data can be directly saved. Win10 system supports touch operation and has higher detection efficiency.
QWe mainly use it to inspect semiconductor wafer and circuit board slices. Is this XTL-20B Metallurgical Microscopy suitable?
A Suitable! This one is specially optimized for small and medium size semiconductors and FPD inspection. The focusing and lighting control are designed to be easy to operate with one hand. The transparent reflection dual Illuminant can handle transparent and non-transparent samples, and the stress-free objective can ensure detection accuracy, which fully meets industry standards.
QNeed to do material metallographic analysis and measurement, what function is more practical?
A It is recommended to choose 100X non-stress oil lens and 5 million pixel CMOS electronic eyepiece. 100X objective lens can see more subtle organizational structure, while high definition electronic eyepiece with its own measurement software can directly measure length, area and painting label, data recording is particularly convenient.
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