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Bruker Dektak XTL Probe Profile Gauge System Specifications

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Bruker Dektak XTL probe Profile Gauge

Brand:Bruker

Model:Dektak XTL

Name:Probe Profile Gauge System

DetailsContact
Specifications
Dimensions 978*954*1714mm
Operating Conditions Temperature range: 20 ° to 25 ℃ (68 ° to 77 ° F) working interval; Humidity range: ≤ 80%, no condensation
Software options: Automatic graphic recognition; advanced software interface
Vibration isolation High performance vibration isolation, passive pneumatic air isolator
scan length 300mm
Number of data points covered per scan 120,000, maximum
Maximum sample thickness 50mm
Maximum wafer size 300mm
Maximum sample Volume 350mm
Step height reproducibility < 5 Angstroms @0.1 micron height master standard, 1 standard deviation
vertical range 1mm
Vertical resolution Maximum 1 Angstrom (@6.55 μm range)
Input Power 100 to 240VAC, 50 to 60Hz
Weight 272kg (600lbs)
Packing list
After-sales instructions

None

[Note] For after-sales services outside the Chinese mainland, if the instrument requires repair, the shipping and possible associated taxes shall be borne by the sender. Generation address of the manual: http://en.nbchao.com/p/6286/Specification.html , which is only used by users who purchase commodities from the NBCHAO.