The TCVN 5876-1995 standard specifies a non-Destructiveness method for determining the film thickness of anodic oxide coatings on aluminum and aluminum alloys using a beam of light microscope. The method is suitable for the measurement of the actual film thickness of anodic oxide coatings, and the film thickness is determined by comparing the difference in the propagation path of the beam of light in the oxide film. The standard describes the measurement process, equipment requirements and result representation in detail, ensuring the accuracy and conformity of the measurement.
| Status | Active |
|---|---|
| CCS | (H20) 金属理化性能试验方法综合 | ICS | (25.220.40) 金属镀层 |
| Release Date | Implementation Date |