The ASTM B567-1998A (2009) standard provides a test method for the measurement of metal and Non-metallic coating thickness on metal and Non-metallic substrates using the beta-ray backscatter method. This method is performed by nondestructive measurement of the coating mass over unit area, which can also be expressed as linear Film thickness if the coating Density is known. Applies to coatings and substrates with appropriate differences in atomic number or equivalent atomic number. The standard emphasizes the importance of safe use and proper handling of radioisotopes and prescribes values expressed in SI as standards. It is the responsibility of the user to establish appropriate safety, health and environment practices prior to use and to determine the applicability of regulatory restrictions.
| Status | Active |
|---|---|
| CCS | (A29) 材料防护 | ICS | (25.220) 表面处理和镀涂 |
| Release Date | Implementation Date | 1998-11-10 00:00:00 |