The ISO 18452 standard specifies the method of measuring the film thickness of fine ceramics (including advanced ceramics and advanced technical ceramics) using contact probe Profile Gauge. The standard is applicable to the thickness measurement of fine ceramic films and provides detailed test procedures and requirements. By using contact probe Profile Gauge, it is possible to accurately measure the thickness of ceramic films and ensure that the film mass meets the application requirements. This standard has an important guiding role in the quality control of ceramic film materials, the accuracy requirements in the research and development and production process, and is widely used in the field of advanced ceramics.
| Status | Active |
|---|---|
| CCS | ICS | 81.060.30 |
| Release Date | 2005-11-15 00:00:00 | Implementation Date |