IEC 60749-42 《Semiconductor devices – Mechanical and climatic test methods – Part 42: Temperature and humidity storage》 Related products

The IEC 60749-42 standard specifies mechanical and climate test methods for semiconductor devices under temperature and humidity storage conditions. This test is designed to evaluate the performance and reliability of semiconductor devices in high temperature and humidity environments. During the test, the device needs to be stored under the specified temperature and humidity conditions to simulate the extreme environment that may be encountered in actual use. Through such tests, potential failure modes of the device under complex environment conditions can be effectively identified, providing a basis for product design improvement and quality control.