The IEC 60068-2-38 standard specifies the method of compound temperature Humidity cycle testing (test Z/AD), which is mainly used to evaluate the tolerance of electronic components in alternating high temperature, high humidity and low temperature environments. The test accelerates the aging process of the sample by simulating extreme environmental conditions, thus quickly assessing its Reliability in harsh environments. The test includes multiple cycles, each containing high temperature, high humidity, low temperature and recovery stages, simulating the "breathing" effect and condensation phenomena that the sample may encounter in actual use. The standard applies to component-level samples and does not apply to samples that are energized throughout. This method is widely used in the development, quality control and certification of electronic devices to help manufacturers optimize product design and ensure long-term Stability in complex environments.
| Status | Active |
|---|---|
| CCS | ICS | 19.040 |
| Release Date | 2021-03-01 00:00:00 | Implementation Date |