ASTM B567-98 (2021) describes a method for nondestructive measurement of Coating thickness on metallic and Non-metallic substrates using beta backscattering. This method is suitable for cases where the atomic number of the coating and the substrate match, and the mass or thickness of the coating can be measured (assuming the coating density is known). Although beta backscattering provides a reliable measurement method, it requires handling of radioisotopes when using this method, and users are required to comply with relevant safety and radioactive material handling regulations.
| Status | Active |
|---|---|
| CCS | ICS |
| Release Date | Implementation Date |