GB/T 20724-2006 stipulates the method of measuring thin crystal Film thickness by convergent beam electron diffraction. The standard covers measurement principles, instrumentation, sample preparation and operation procedures, specifies diffraction conditions, data collection and analysis methods, and accurately determines thin crystal Film thickness by convergent beam electron diffraction technology. Provide scientific and standardized measurement methods and unified standards for thin crystal material research, production mass testing, etc.
| Status | Abolish |
|---|---|
| CCS | N53 | ICS | 71.040.99 |
| Release Date | 2006-12-25 00:00:00 | Implementation Date | 2007-08-01 00:00:00 |