GB/T 24193-2009 《Chromium ores and concentrates - Determination of aluminium, iron , magnesium and silicon content - Inductively coupled plasma atomic emission spectrometry》 Related products
The GB/T 24193-2009 standard specifies a method for the determination of aluminum, iron, mg and silicon content in chromium ores and chromium concentrates using the Inductance Coupled Plasma Atomic Emission Spectroscopy (AES) method (ICP-AES). The standard applies to the detection of aluminum, iron, mg and silicon concentrations in these ores. The method involves using a molten sample of sodium peroxide, leaching with muriatic acid, and diluting the solution to a certain volume. Afterwards, the solution is atomized by a high salt resistant Nebulizer and introduced into the Inductance Coupled Plasma for analysis. The emission Light spectrum intensity of each element is determined and the concentration is calculated by calibrating Linear dispersion. This process ensures the accuracy and Reliability of the measurement results.
| Status | Active |
|---|---|
| CCS | D33 | ICS | 73.060.30 |
| Release Date | 2009-07-08 00:00:00 | Implementation Date | 2010-04-01 00:00:00 |
-
$ 345.00 -
$ 485.00
- 1GB/T 24194-2009《Ferrosilicon - Determination of aluminium, calcium, manganese, chromium, titanium, copper, phosphorus and nickel content - Inductively coupled plasma atomic emission spectrometric method》
- 2GB/T 24197-2009《Manganese ores - Determination of iron，silicon，aluminium，calcium，barium，magnesium，potassium，copper，nickel，zinc，phosphorus，cobalt，chromium，vanadium，arsenic，lead，titanium and vanadium - Inductively coupled plasma atomic emission spectrometry》
- 3GB/T 23710-2009《Determination of betaine in feeds - Ion chromatography》
- 4GB/T 23942-2009《Chemical reagent - General rules for inductively coupled plasma atomic emission spectrometry》
- 5GB/T 24794-2009《Photographic chemicals - Measurement methods of the trace elements in the organic compounds - Inductively coupled plasma atomic emission spectrometry (ICP-AES)》
- 6GB/T 24800.13-2009《Determination of nitrite in cosmetics by ion chromatography method》
- 7GB/T 14141-2009《Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array》
- 8GB/T 24582-2009《Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry》
- 9GB/T 16484.20-2009《Chemical analysis methods of rare earth chloride and light rare earth carbonate - Part 20: Determination of nickel oxide, manganese oxide, lead oxide, aluminum oxide, zinc oxide, thorium oxide content - Inductively coupled plasma mass spectrometry》
- 10GB/T 16484.2-2009《Chemical analysis methods of rare earth chloride and light rare earth carbonate - Part 2: Determination of europium oxide content - Inductively coupled plasma mass spectrometry》