GB/T 4937.4-2012 specifies the highly accelerated steady-state humidity cabinet test (HAST) method for semiconductor devices. The standard specifies special test equipment, which can realize high temperature, high humidity and high pressure environment simulation, and give accurate equipment parameters. The operation process of exposing semiconductor devices to harsh temperature Humidity and pressure conditions is described in detail. Reliability is quickly evaluated by observing the performance changes of devices in strongly accelerated steady-state heat and humidity environments, such as electrical parameter drift and failure conditions. The standard provides efficient means for mass control of semiconductor devices, helps to screen high-quality products, and ensures their stable operation in complex environments.
| Status | Active |
|---|---|
| CCS | L40 | ICS | 31.080.01 |
| Release Date | 2012-11-05 00:00:00 | Implementation Date | 2013-02-15 00:00:00 |