This standard specifies the general requirements, test preparation and test methods for high accelerated life testing (HALT), which is applicable to the development, design, pilot run and mass production stages of electrical and electronic products and their components. The stresses applied by the HALT test include high temperature stepping, low temperature stepping, rapid temperature change cycle and six degrees of freedom non-Gaussian broadband random vibration to evaluate the Reliability of the product under extreme conditions.
| Status | Active |
|---|---|
| CCS | K04 | ICS | 19.040 |
| Release Date | 2012-12-31 00:00:00 | Implementation Date | 2013-06-01 00:00:00 |