The GB/T 4937.23-2023 standard belongs to the category of mechanical and climate test methods for semiconductor devices, focusing on the high temperature operating life test of Part 23. It clarifies the process of testing the operating life of semiconductor devices in a simulated high temperature environment, including test equipment, condition setting, sample preparation and monitoring methods. Through this standard, the durability of devices under high temperature conditions can be accurately evaluated, providing a key basis for mass control and Reliability improvement of semiconductor products, and assisting their design and production in high temperature application scenarios.
| Status | Active |
|---|---|
| CCS | L40 | ICS | 31.080.01 |
| Release Date | 2023-05-23 00:00:00 | Implementation Date | 2023-12-01 00:00:00 |