This standard specifies equipment, samples, determination methods, data processing, uncertainty of measurement results and test report requirements for the measurement of dislocation density in thin metal crystals by Transmission Electron Microscope (EM) (TEM). It is suitable for the determination of dislocation density in thin metal crystals with a grain thickness of not more than 1 × 10 ^ 15m ^ -2, especially for dislocation density measurement in a single grain in thin crystals with a thickness of tens of nanometers to hundreds of nanometers. The standard ensures the accuracy and Reliability of dislocation density measurement and provides important support for scientific research and industrial production of metal materials.
| Status | Active |
|---|---|
| CCS | G04 | ICS | 71.040.50 |
| Release Date | 2023-09-07 00:00:00 | Implementation Date | 2024-04-01 00:00:00 |