GB/T 11297.7 - 1989 Focus on the resistivity and Hall coefficient test of indium antimonide single crystal. It is based on the relevant electrical principles and defines the test method. Specify the required test instruments, such as the accuracy requirements of the Vanderbilt tester. Detail the preparation of indium antimonide single crystal samples, including cutting, grinding, corrosion and other steps to ensure that the samples meet the test standards. Standardize the test process, covering temperature control, current loading, voltage measurement and Hall voltage acquisition. With the help of this standard, the key electrical parameters of indium antimonide single crystal can be accurately determined, providing core data support for its application in semiconductor and other fields.
| Status | Active |
|---|---|
| CCS | L32 | ICS |
| Release Date | 1989-03-31 00:00:00 | Implementation Date | 1990-01-01 00:00:00 |