GB/T 17473.1-2008 《Test methods of precious metals pastes used for microelectronics-Determination of solids content》 Related products

This standard specifies the test method for solids by volume of precious metal slurry for microelectronics technology. It is suitable for the determination of solids by volume of precious metal slurry for various sintering and curing microelectronics technologies.

This summary is not the original standard text and is for reference only. For accurate information, please obtain it through official channels.

Status	Active
CCS	H68
ICS	77.120.99
Release Date	2008-03-31 00:00:00
Implementation Date	2008-09-01 00:00:00

Sort Filter

Featured Hot Price

No information related to was found

Extended reading

1GB/T 17473.3-2008《Test methods of precious metals pastes used for microelectronics Determination of sheet resistance》
2GB/T 17473.6-2008《Test methods of precious metal pastes used for microelectronics - Determination of resolution》
3GB/T 33818-2017《Carbon nanotube conductive paste》
4GB/T 13557-1992《Test methods for flexible copper-clad material for printed circuits》
5GB/T 17473.2-2008《Test methods of presious metals pastes used for microelectronics - Determination of fineness》
6GB/T 17260-2008《Determination of fineness of flax - Permeametric method》
7GB/T 12729.4-2008《Spices and condiments - Determination of degree of fineness of grinding - Hand sieving method》
8GB/T 5507-2008《Inspection of grain and oils - Determination for fineness degree of flours》
9GB/T 18147.4-2015《Test method for hemp fiber—Part 4: Test method for fineness of hemp fiber》
10GB/T 34783-2017《Determination of fineness of ramie fiber—Pneumatic method》

Menu Category Contact