INESA SGW X-4 Melting point meter
SE
RT+~320℃Capillary method, hot table methodvisual±1℃(≤200℃)；±2℃(>200℃)±1℃(≤200℃)；±2℃(>200℃)
Microscope observation, support capillary method and hot table method to determine melting point, suitable for crystalline organic compounds in chemical, Spinning & weaving, fuel and other fields. Microscope magnification up to 40X, temperature range RT +~ 320 ℃, temperature resolution of 1 ℃
