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TEELEN XTL-16B Transmission reflection Metallurgical Microscopy SE
Trinocular reflection Polarizing Microscope 50-500 times

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Zhongke Purui IPRE4XC Metallurgical Microscopy trinocular inverted, eyepiece magnification 10X SE
100X~1000X

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TEELEN 4XB Binocular Inverted Metallurgical Microscopy SE
100X~1250X

Binocular Inverted Metallurgical Microscopy 100-1250 times

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TEELEN XTL-16A Metallurgical Microscopy SE
Trinocular Epipolarizing Microscope Magnification 50-500 Times

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IPRE4XC Metallurgical Microscopy Objective Lens 5X/10X/20X/60X SE
100X~1000X

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TEELEN XTL-18BD Inverted Metallurgical Microscopy SE
Trinocular Inverted Metallurgical Microscopy with 50-500 times LED Light Source

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TEELEN ICM-100BD Industrial Inspection Microscope SE
Trinocular observation Industrial inspection Microscope infinity system 50-500 times

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IPRE FL8000W Trinocular Upright Metallurgical Microscopy SE
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TEELEN 4XC Trinocular Inverted Metallurgical Microscopy SE
100X~1250X

Trinocular Inverted Metallurgical Microscopy 100-1250 times

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TEELEN ICM-100 Industrial Inspection Microscope SE
Trinocular observation Industrial inspection Microscope infinity system 50-500 times

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TEELEN 4XCE Computerized Trinocular Inverted Metallurgical Microscopy SE
Trinocular inverted Metallurgical Microscopy 100-1250 times, including 300w and a set of metallographic inspection and analysis software, microcomputer user-equipped

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TEELEN XTL-302 Brightfield Upright Metallurgical Microscopy SE
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$ 1703.00

TEELEN XTL-12B Inverted Metallurgical Microscopy Low Matching SE
10X、20X、40X、50X

Low configuration, without computer, objective magnification is 5X, 10X, 20X, 50X, using finite color difference correction system, internal positioning four-hole converter.

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TEELEN 4XI Monocular Inverted Metallurgical Microscopy SE
100X~1250X

Monocular Inverted Metallurgical Microscopy 100-1250 times

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TEELEN XTL-12B Inverted Metallurgical Microscopy SE
10X、20X、40X、50X

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$ 1750.00

TEELEN XTL-20B Metallurgical Microscopy Infinite High Light Reuters reflection Double Illuminant
Using infinite high-beam path technology, providing a full field of view high definition image, support reflection dual Illuminant observation, fretting grid value of 0.002mm, clear detection of transparent or non-transparent samples, light field compensation to remove reflective points.

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